naa a22 4500 510803830 CHVBK 20180411083407.0 cr unu---uuuuu 180411e20131001xx s 000 0 eng 10.1007/s11664-013-2695-8 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2695-8 Experimental Investigation and Thermodynamic Calculationof the Phase Equilibria in the Cu-Ni-Sb Ternary System [Elektronische Daten] [C.P. Wang, F. Huang, Y. Lu, S. Yang, M.J. Yang, X.J. Liu] We investigated the phase equilibria in the Cu-Ni-Sb ternary system at 800°C, 900°C, 1000°C, and 1100°C using equilibrated ternary alloys by optical microscopy, electron probe microanalysis, energy-dispersive spectroscopy, and x-ray diffraction analysis. Based on the experimental phase equilibria data, the Cu-Ni-Sb ternary system was thermodynamically optimized by calculating phase diagrams using the CALPHAD method. Substitutional solution and sublattice models were used to describe the solution and intermediate phases, respectively. The self-consistent parameters describing the Gibbs energy of each phase in the Cu-Ni-Sb system were optimized, obtaining reasonable agreement between the calculated results and most of the experimental data. TMS, 2013 Pb-free solders nationallicence Cu-Ni-Sb system nationallicence phase equilibria nationallicence CALPHAD method nationallicence Wang C.P. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut Huang F. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut Lu Y. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut Yang S. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut Yang M.J. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut Liu X.J. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/10(2013-10-01), 2961-2974 0361-5235 42:10<2961 2013 42 11664 https://doi.org/10.1007/s11664-013-2695-8 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2695-8 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Wang C.P. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut NATIONALLICENCE 700 1- Huang F. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut NATIONALLICENCE 700 1- Lu Y. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut NATIONALLICENCE 700 1- Yang S. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut NATIONALLICENCE 700 1- Yang M.J. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut NATIONALLICENCE 700 1- Liu X.J. Department of Materials Science and Engineering, College of Materials, and Research Center of Materials Design and Applications, Xiamen University, 361005, Xiamen, People's Republic of China aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/10(2013-10-01), 2961-2974 0361-5235 42:10<2961 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer