naa a22 4500 510804578 CHVBK 20180411083410.0 cr unu---uuuuu 180411e20130501xx s 000 0 eng 10.1007/s11664-012-2342-9 doi (NATIONALLICENCE)springer-10.1007/s11664-012-2342-9 Fermi Level Control of Point Defects During Growth of Mg-Doped GaN [Elektronische Daten] [Zachary Bryan, Marc Hoffmann, James Tweedie, Ronny Kirste, Gordon Callsen, Isaac Bryan, Anthony Rice, Milena Bobea, Seiji Mita, Jinqiao Xie, Zlatko Sitar, Ramón Collazo] In this study, Fermi level control of point defects during metalorganic chemical vapor deposition (MOCVD) of Mg-doped GaN has been demonstrated by above-bandgap illumination. Resistivity and photoluminescence (PL) measurements are used to investigate the Mg dopant activation of samples with Mg concentration of 2×1019cm−3 grown with and without exposure to ultraviolet (UV) illumination. Samples grown under UV illumination have five orders of magnitude lower resistivity values compared with typical unannealed GaN:Mg samples. The PL spectra of samples grown with UV exposure are similar to the spectra of those grown without UV exposure that were subsequently annealed, indicating a different incorporation of compensating defects during growth. Based on PL and resistivity measurements we show that Fermi level control of point defects during growth of III-nitrides is feasible. TMS, 2012 Mg nationallicence GaN nationallicence UV excitation nationallicence Photoluminescence nationallicence Metal-organic chemical vapordeposition (MOCVD) nationallicence Bryan Zachary Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Hoffmann Marc Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Tweedie James Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Kirste Ronny Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Callsen Gordon Institut für Festkörperphysik, TU-Berlin, Hardenbergstraße 36, 10623, Berlin, Germany aut Bryan Isaac Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Rice Anthony Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Bobea Milena Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Mita Seiji HexaTech, Inc., 991 Aviation Pkwy., Suite 800, 27560, Morrisville, NC, USA aut Xie Jinqiao HexaTech, Inc., 991 Aviation Pkwy., Suite 800, 27560, Morrisville, NC, USA aut Sitar Zlatko Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Collazo Ramón Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/5(2013-05-01), 815-819 0361-5235 42:5<815 2013 42 11664 https://doi.org/10.1007/s11664-012-2342-9 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-012-2342-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Bryan Zachary Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Hoffmann Marc Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Tweedie James Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Kirste Ronny Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Callsen Gordon Institut für Festkörperphysik, TU-Berlin, Hardenbergstraße 36, 10623, Berlin, Germany aut NATIONALLICENCE 700 1- Bryan Isaac Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Rice Anthony Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Bobea Milena Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Mita Seiji HexaTech, Inc., 991 Aviation Pkwy., Suite 800, 27560, Morrisville, NC, USA aut NATIONALLICENCE 700 1- Xie Jinqiao HexaTech, Inc., 991 Aviation Pkwy., Suite 800, 27560, Morrisville, NC, USA aut NATIONALLICENCE 700 1- Sitar Zlatko Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Collazo Ramón Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/5(2013-05-01), 815-819 0361-5235 42:5<815 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer