naa a22 4500 51080473X CHVBK 20180411083411.0 cr unu---uuuuu 180411e20130501xx s 000 0 eng 10.1007/s11664-013-2498-y doi (NATIONALLICENCE)springer-10.1007/s11664-013-2498-y Toward Discrete Axial p - n Junction Nanowire Light-Emitting Diodes Grown by Plasma-Assisted Molecular Beam Epitaxy [Elektronische Daten] [Matt Brubaker, Paul Blanchard, John Schlager, Aric Sanders, Andrew Herrero, Alexana Roshko, Shannon Duff, Todd Harvey, Victor Bright, Norman Sanford, Kris Bertness] In this paper we investigate axial p-n junction GaN nanowires grown by plasma-assisted molecular beam epitaxy (MBE), with particular attention to the effect of Mg doping on the device characteristics of individual nanowire light-emitting diodes (LEDs). We observe that a significant fraction of single-nanowire LEDs produce measurable band-gap electroluminescence when a thin AlGaN electron blocking layer (EBL) is incorporated into the device structure near the junction. Similar devices with no EBL typically yield below-detection-limit electroluminescence, despite diode-like I-V characteristics and optically measured internal quantum efficiencies (IQEs) of ∼1%. I-V measurements of the p-regions in p-n junction nanowires, as well as nanowires doped with Mg only, indicate low p-type conductivity and asymmetric Schottky-like p-contacts. These observations suggest that imbalanced carrier injection from the junction and p-contact can produce significant nonradiative losses. TMS (outside the USA), 2013 Gallium nitride nationallicence nanowires nationallicence light-emitting diodes nationallicence molecular beam epitaxy nationallicence Brubaker Matt Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Blanchard Paul Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Schlager John Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Sanders Aric Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Herrero Andrew Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Roshko Alexana Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Duff Shannon Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Harvey Todd Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Bright Victor Department of Mechanical Engineering, University of Colorado, Boulder, CO, USA aut Sanford Norman Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Bertness Kris Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/5(2013-05-01), 868-874 0361-5235 42:5<868 2013 42 11664 https://doi.org/10.1007/s11664-013-2498-y text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2498-y text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Brubaker Matt Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 700 1- Blanchard Paul Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 700 1- Schlager John Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 700 1- Sanders Aric Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 700 1- Herrero Andrew Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 700 1- Roshko Alexana Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 700 1- Duff Shannon Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 700 1- Harvey Todd Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 700 1- Bright Victor Department of Mechanical Engineering, University of Colorado, Boulder, CO, USA aut NATIONALLICENCE 700 1- Sanford Norman Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 700 1- Bertness Kris Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/5(2013-05-01), 868-874 0361-5235 42:5<868 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer