naa a22 4500 510805078 CHVBK 20180411083412.0 cr unu---uuuuu 180411e20131101xx s 000 0 eng 10.1007/s11664-013-2759-9 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2759-9 Investigation of Trap States in Mid-Wavelength Infrared TypeII Superlattices Using Time-Resolved Photoluminescence [Elektronische Daten] [Blair Connelly, Grace Metcalfe, Hongen Shen, Michael Wraback, Chadwick Canedy, Igor Vurgaftman, Joseph Melinger, Chaffra Affouda, Eric Jackson, Jill Nolde, Jerry Meyer, Edward Aifer] Time-resolved photoluminescence (TRPL) spectroscopy is used to study the minority-carrier lifetime in mid-wavelength infrared, n-type, InAs/Ga1−x In x Sb typeII superlattices (T2SLs) and investigate the recombination mechanisms and trap states that currently limit their performance. Observation of multiple exponential decays in the intensity-dependent TRPL data indicates trap saturation due to the filling then emptying of trap states and different Shockley-Read-Hall (SRH) lifetimes for minority and majority carriers, with τ maj(τ n0)≫τ min(τ p0). Simulation of the photoluminescence transient captures the qualitative behavior of the TRPL data as a function of temperature and excess carrier density. A trap state native to Ga1−x In x Sb is identified from the low-injection temperature-dependent TRPL data and found to be located below the intrinsic Fermi level of the superlattice, approximately 60±15meV above the valence-band maximum. Low-temperature TRPL data show a variation of the minority-carrier SRH lifetime, τ p0, over a set of InAs/Ga1−x In x Sb T2SLs, where τ p0 increases as x is varied from 0.04 to 0.065 and the relative layer thickness of Ga1−x In x Sb is increased by 31%. TMS, 2013 TypeII superlattice nationallicence minority-carrier lifetime nationallicence time-resolved photoluminescence nationallicence Shockley-Read-Hall nationallicence trap saturation nationallicence infrared nationallicence Connelly Blair U.S. Army Research Laboratory, RDRL-SEE-M, 2800 Powder Mill Road, 20783, Adelphi, MD, USA aut Metcalfe Grace U.S. Army Research Laboratory, RDRL-SEE-M, 2800 Powder Mill Road, 20783, Adelphi, MD, USA aut Shen Hongen U.S. Army Research Laboratory, RDRL-SEE-M, 2800 Powder Mill Road, 20783, Adelphi, MD, USA aut Wraback Michael U.S. Army Research Laboratory, RDRL-SEE-M, 2800 Powder Mill Road, 20783, Adelphi, MD, USA aut Canedy Chadwick U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut Vurgaftman Igor U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut Melinger Joseph U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut Affouda Chaffra U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut Jackson Eric U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut Nolde Jill U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut Meyer Jerry U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut Aifer Edward U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3203-3210 0361-5235 42:11<3203 2013 42 11664 https://doi.org/10.1007/s11664-013-2759-9 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2759-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Connelly Blair U.S. Army Research Laboratory, RDRL-SEE-M, 2800 Powder Mill Road, 20783, Adelphi, MD, USA aut NATIONALLICENCE 700 1- Metcalfe Grace U.S. Army Research Laboratory, RDRL-SEE-M, 2800 Powder Mill Road, 20783, Adelphi, MD, USA aut NATIONALLICENCE 700 1- Shen Hongen U.S. Army Research Laboratory, RDRL-SEE-M, 2800 Powder Mill Road, 20783, Adelphi, MD, USA aut NATIONALLICENCE 700 1- Wraback Michael U.S. Army Research Laboratory, RDRL-SEE-M, 2800 Powder Mill Road, 20783, Adelphi, MD, USA aut NATIONALLICENCE 700 1- Canedy Chadwick U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut NATIONALLICENCE 700 1- Vurgaftman Igor U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut NATIONALLICENCE 700 1- Melinger Joseph U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut NATIONALLICENCE 700 1- Affouda Chaffra U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut NATIONALLICENCE 700 1- Jackson Eric U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut NATIONALLICENCE 700 1- Nolde Jill U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut NATIONALLICENCE 700 1- Meyer Jerry U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut NATIONALLICENCE 700 1- Aifer Edward U.S. Naval Research Laboratory, 4555 Overlook Ave. SW, 20375, Washington, DC, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3203-3210 0361-5235 42:11<3203 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer