naa a22 4500 510805167 CHVBK 20180411083413.0 cr unu---uuuuu 180411e20131101xx s 000 0 eng 10.1007/s11664-013-2701-1 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2701-1 Smith David Department of Physics, Arizona State University, 85287, Tempe, AZ, USA aut Atomic-Scale Characterization of II-VI Compound Semiconductors [Elektronische Daten] [David Smith] Alloys of II-VI compound semiconductors with suitable band gap selection potentially provide broad coverage of wavelengths for photodetector applications. Achievement of high-quality epitaxial growth is, however, essential for successful development of integrated photonic and optoelectronic devices. Atomic-scale characterization of structural defects in II-VI heterostructures using electron microscopy plays an invaluable role in accomplishing this goal. This paper reviews some recent high-resolution studies of II-VI compound semiconductors with zincblende crystal structure, as grown epitaxially on commonly used substrates. Exploratory studies using aberration-corrected electron microscopes are also briefly considered. TMS, 2013 High-resolution electron microscopy nationallicence zinc telluride nationallicence cadmium telluride nationallicence mercury cadmium telluride nationallicence mercury cadmium selenide nationallicence aberration-corrected electron microscopy nationallicence Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3168-3174 0361-5235 42:11<3168 2013 42 11664 https://doi.org/10.1007/s11664-013-2701-1 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2701-1 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Smith David Department of Physics, Arizona State University, 85287, Tempe, AZ, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3168-3174 0361-5235 42:11<3168 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer