naa a22 4500 510805191 CHVBK 20180411083413.0 cr unu---uuuuu 180411e20131101xx s 000 0 eng 10.1007/s11664-013-2658-0 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2658-0 Performance of 12- μ m- to 15- μ m-Pitch MWIR and LWIR HgCdTe FPAs at Elevated Temperatures [Elektronische Daten] [Roger Strong, Michael Kinch, John Armstrong] Infrared (IR) focal-plane arrays (FPAs) with higher operating temperatures and smaller pitches enable reduced size, weight, and power in infrared systems. We have characterized a large number of medium- and long-wavelength IR (MWIR and LWIR) FPAs as a function of temperature and cutoff wavelength to determine the impact of these parameters on their performance. The 77-K cutoff wavelength range for the MWIR arrays was 5.0μm to 5.6μm, and 8.6μm to 11.3μm for the LWIR. The dark currents in DRS's high-density vertically integrated photodiode (HDVIP)® FPAs (based on a front-side- illuminated, via-interconnected, cylindrical-geometry N+/N/P architecture) are dominated by Auger-7 recombination from 120K to 200K for the MWIR and 70K to 100K for the LWIR. In these temperature ranges the FPA operability is generally limited not by dark current defects but by noise defects. Pixels with high 1/f noise should produce a tail in the root-mean-square (rms) noise distribution. We have found that the skewness of the rms noise distribution is the simplest measure of an array's 1/f noise, and that the rms noise skewness typically shows little variation over these temperature ranges. The temperature dependence of the defect counts in normal arrays (wet etched prior to CdTe interdiffusion) increases as n i, while nonstandard arrays (ion milled or plasma etched prior to CdTe interdiffusion) can have high 1/f noise and defect counts that vary as n i 2 . Our models indicate that, if the dominant dark current is due to diffusion, then the 1/f noise varies as n i 2 , whereas if depletion current dominates, then the 1/f noise varies as n i. Systemic 1/f noise is not an issue for DRS's standard MWIR FPAs at 110K to 160K, or for standard LWIR FPAs at 77K to 100K. TMS, 2013 Infrared nationallicence FPA nationallicence MWIR nationallicence LWIR nationallicence 1/ f noise nationallicence dark current nationallicence Strong Roger DRS Reconnaissance Surveillance and Target Recognition, Dallas, TX, USA aut Kinch Michael DRS Reconnaissance Surveillance and Target Recognition, Dallas, TX, USA aut Armstrong John DRS Reconnaissance Surveillance and Target Recognition, Dallas, TX, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3103-3107 0361-5235 42:11<3103 2013 42 11664 https://doi.org/10.1007/s11664-013-2658-0 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2658-0 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Strong Roger DRS Reconnaissance Surveillance and Target Recognition, Dallas, TX, USA aut NATIONALLICENCE 700 1- Kinch Michael DRS Reconnaissance Surveillance and Target Recognition, Dallas, TX, USA aut NATIONALLICENCE 700 1- Armstrong John DRS Reconnaissance Surveillance and Target Recognition, Dallas, TX, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3103-3107 0361-5235 42:11<3103 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer