naa a22 4500 510805248 CHVBK 20180411083413.0 cr unu---uuuuu 180411e20131101xx s 000 0 eng 10.1007/s11664-013-2660-6 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2660-6 Cross-Sectional Study of Macrodefects in MBE Dual-Band HgCdTe on CdZnTe [Elektronische Daten] [M. Reddy, D. Lofgreen, K. Jones, J. Peterson, W. Radford, J. Benson, S. Johnson] HgCdTe dual-band mid-wave infrared/long-wave infrared focal-plane arrays on CdZnTe are a key component in advanced electrooptic sensor applications. Molecular beam epitaxy (MBE) has been used successfully for growth of dual-band layers on larger CdZnTe substrates. However, the macrodefect density, which is known to reduce the pixel operability and its run-to-run variation, is larger when compared with layers grown on Si substrate. This paper reports the macrodefect density versus size signature of a well-optimized MBE dual-band growth and a cross-sectional study of a macrodefect that represents the most prevalent class using focused ion beam, scanning transmission electron microscopy, and energy-dispersive x-ray spectroscopy. The results show that the macrodefect originates from a void, which in turn is associated with a pit on the CdZnTe substrate. TMS, 2013 MBE nationallicence HgCdTe nationallicence dual band nationallicence macrodefects nationallicence STEM nationallicence FIB nationallicence Reddy M. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut Lofgreen D. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut Jones K. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut Peterson J. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut Radford W. U.S. Army RDECOM, CERDEC Night Vision and Electronic Sensors, Fort Belvoir, VA, USA aut Benson J. U.S. Army RDECOM, CERDEC Night Vision and Electronic Sensors, Fort Belvoir, VA, USA aut Johnson S. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3114-3118 0361-5235 42:11<3114 2013 42 11664 https://doi.org/10.1007/s11664-013-2660-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2660-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Reddy M. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Lofgreen D. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Jones K. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Peterson J. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Radford W. U.S. Army RDECOM, CERDEC Night Vision and Electronic Sensors, Fort Belvoir, VA, USA aut NATIONALLICENCE 700 1- Benson J. U.S. Army RDECOM, CERDEC Night Vision and Electronic Sensors, Fort Belvoir, VA, USA aut NATIONALLICENCE 700 1- Johnson S. Raytheon Vision Systems, 75 Coromar Dr., B-2/8, 93117, Goleta, CA, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3114-3118 0361-5235 42:11<3114 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer