naa a22 4500 510805442 CHVBK 20180411083415.0 cr unu---uuuuu 180411e20131101xx s 000 0 eng 10.1007/s11664-013-2798-2 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2798-2 High-Performance M/LWIR Dual-Band HgCdTe/Si Focal-Plane Arrays [Elektronische Daten] [M. Vilela, K. Olsson, E. Norton, J. Peterson, K. Rybnicek, D. Rhiger, C. Fulk, J. Bangs, D. Lofgreen, S. Johnson] Mercury cadmium telluride (HgCdTe) grown on large-area silicon (Si) substrates allows for larger array formats and potentially reduced focal-plane array (FPA) cost compared with smaller, more expensive cadmium zinc telluride (CdZnTe) substrates. In this work, the use of HgCdTe/Si for mid- wavelength/long-wavelength infrared (M/LWIR) dual-band FPAs is evaluated for tactical applications. A number of M/LWIR dual-band HgCdTe triple-layer n-P-n heterojunction device structures were grown by molecular-beam epitaxy (MBE) on 100-mm (211)Si substrates. Wafers exhibited low macrodefect densities (< 300 cm−2). Die from these wafers were mated to dual-band readout integrated circuits to produce FPAs. The measured 81-K cutoff wavelengths were 5.1 μm for band 1 (MWIR) and 9.6 μm for band 2 (LWIR). The FPAs exhibited high pixel operability in each band with noise-equivalent differential temperature operability of 99.98% for the MWIR band and 98.7% for the LWIR band at 81 K. The results from this series are compared with M/LWIR FPAs from 2009 to address possible methods for improvement. Results obtained in this work suggest that MBE growth defects and dislocations present in devices are not the limiting factor for detector operability, with regards to infrared detection for tactical applications. TMS, 2013 HgCdTe nationallicence dual band nationallicence FPAs nationallicence Si substrates nationallicence infrared detectors nationallicence molecular-beam epitaxy (MBE) nationallicence Vilela M. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Olsson K. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Norton E. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Peterson J. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Rybnicek K. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Rhiger D. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Fulk C. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Bangs J. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Lofgreen D. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Johnson S. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3231-3238 0361-5235 42:11<3231 2013 42 11664 https://doi.org/10.1007/s11664-013-2798-2 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2798-2 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Vilela M. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Olsson K. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Norton E. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Peterson J. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Rybnicek K. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Rhiger D. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Fulk C. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Bangs J. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Lofgreen D. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 700 1- Johnson S. Raytheon Vision Systems, 75 Coromar Drive, 93117, Goleta, CA, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/11(2013-11-01), 3231-3238 0361-5235 42:11<3231 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer