naa a22 4500 510817726 CHVBK 20180411083516.0 cr unu---uuuuu 180411e20130601xx s 000 0 eng 10.1007/s11468-012-9446-1 doi (NATIONALLICENCE)springer-10.1007/s11468-012-9446-1 Comparison of Gold and Silver/Gold Bimetallic Surface for Highly Sensitive Near-infrared SPR Sensor at 1550nm [Elektronische Daten] [Jerome Hottin, Edy Wijaya, Laurent Hay, Sophie Maricot, Mohamed Bouazaoui, Jean-Pierre Vilcot] A large majority of surface plasmon resonance (SPR) sensors reported in the literature are designed to operate in the visible electromagnetic spectrum. However, the near-infrared, particularly at the telecommunications wavelength of 1550nm, is also especially attractive for SPR sensing applications. In fact, SPR sensors operating in this region benefit from narrower resonance and deeper field penetration. In this paper, we report a theoretical and experimental study of an SPR sensor operating at a fixed wavelength of 1550nm. The influence of the choice of metals and the interrogation methods on the sensitivity of the resulting SPR sensor is investigated. Two types of sensor chips (simple gold (Au) and bimetallic silver/Au structure) and three interrogation methods (monitoring of the position of the reflectivity minimum, the position of the centroid, and the intensity evolution of the reflectivity) are examined. We show that a refractive index resolution of 2.7 × 10−6 refractive index unit can be easily obtained, and with further optimization of the measurement system, the ultimate limit of detection is expected to be even lowered. Therefore, the approach discussed here already shows a promising potential for highly sensitive SPR sensors. Springer Science+Business Media, LLC, 2012 Surface plasmon resonance nationallicence Near-infrared nationallicence Sensor nationallicence Gold nationallicence Silver nationallicence Hottin Jerome Laboratoire de Physique des Lasers, Atomes et Molécules (PhLAM), UMR 8523, Bat. P5, Cite Scientifique, 59655, Villeneuve d'Ascq Cedex, France aut Wijaya Edy Institut d'Electronique, de Microélectronique, et de Nanotechnologie (IEMN), UMR 8520, Université Lille 1, Avenue Poincaré BP 60069, 59652, Villeneuve d'Ascq Cedex, France aut Hay Laurent Laboratoire de Physique des Lasers, Atomes et Molécules (PhLAM), UMR 8523, Bat. P5, Cite Scientifique, 59655, Villeneuve d'Ascq Cedex, France aut Maricot Sophie Institut d'Electronique, de Microélectronique, et de Nanotechnologie (IEMN), UMR 8520, Université Lille 1, Avenue Poincaré BP 60069, 59652, Villeneuve d'Ascq Cedex, France aut Bouazaoui Mohamed Laboratoire de Physique des Lasers, Atomes et Molécules (PhLAM), UMR 8523, Bat. P5, Cite Scientifique, 59655, Villeneuve d'Ascq Cedex, France aut Vilcot Jean-Pierre Institut d'Electronique, de Microélectronique, et de Nanotechnologie (IEMN), UMR 8520, Université Lille 1, Avenue Poincaré BP 60069, 59652, Villeneuve d'Ascq Cedex, France aut Plasmonics Springer US; http://www.springer-ny.com 8/2(2013-06-01), 619-624 1557-1955 8:2<619 2013 8 11468 https://doi.org/10.1007/s11468-012-9446-1 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11468-012-9446-1 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Hottin Jerome Laboratoire de Physique des Lasers, Atomes et Molécules (PhLAM), UMR 8523, Bat. P5, Cite Scientifique, 59655, Villeneuve d'Ascq Cedex, France aut NATIONALLICENCE 700 1- Wijaya Edy Institut d'Electronique, de Microélectronique, et de Nanotechnologie (IEMN), UMR 8520, Université Lille 1, Avenue Poincaré BP 60069, 59652, Villeneuve d'Ascq Cedex, France aut NATIONALLICENCE 700 1- Hay Laurent Laboratoire de Physique des Lasers, Atomes et Molécules (PhLAM), UMR 8523, Bat. P5, Cite Scientifique, 59655, Villeneuve d'Ascq Cedex, France aut NATIONALLICENCE 700 1- Maricot Sophie Institut d'Electronique, de Microélectronique, et de Nanotechnologie (IEMN), UMR 8520, Université Lille 1, Avenue Poincaré BP 60069, 59652, Villeneuve d'Ascq Cedex, France aut NATIONALLICENCE 700 1- Bouazaoui Mohamed Laboratoire de Physique des Lasers, Atomes et Molécules (PhLAM), UMR 8523, Bat. P5, Cite Scientifique, 59655, Villeneuve d'Ascq Cedex, France aut NATIONALLICENCE 700 1- Vilcot Jean-Pierre Institut d'Electronique, de Microélectronique, et de Nanotechnologie (IEMN), UMR 8520, Université Lille 1, Avenue Poincaré BP 60069, 59652, Villeneuve d'Ascq Cedex, France aut NATIONALLICENCE 773 0- Plasmonics Springer US; http://www.springer-ny.com 8/2(2013-06-01), 619-624 1557-1955 8:2<619 2013 8 11468 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer