naa a22 4500 510817777 CHVBK 20180411083516.0 cr unu---uuuuu 180411e20130601xx s 000 0 eng 10.1007/s11468-012-9379-8 doi (NATIONALLICENCE)springer-10.1007/s11468-012-9379-8 Plasmonic Coupling Effect in Ag Nanocap-Nanohole Pairs for Surface-Enhanced Raman Scattering [Elektronische Daten] [Xiaolei Wen, Zheng Xi, Xiaojin Jiao, Wenhai Yu, Guosheng Xue, Douguo Zhang, Yonghua Lu, Pei Wang, Steve Blair, Hai Ming] A plasmonic coupling structure composed of Ag nanocap-nanohole pairs was fabricated through a novel and facile method. Both surface-enhanced Raman scattering (SERS) measurements and numerical simulations show that the cap-hole system produces much larger electric field enhancement and SERS signal than the isolated structures, which is due to the plasmonic coupling effect between the gap of the cap and the hole. Additionally, the plasmonic enhancement is sensitive to the gap size, which can be controlled by the Ag layer thickness during the evaporation process. A maximum enhancement factor of 1.1×108 can be obtained with optimized gap size. Springer Science+Business Media, LLC, 2012 Plasmonic interaction nationallicence Surface-enhanced Raman scattering (SERS) nationallicence Hot spot nationallicence Nanoscale gap nationallicence Wen Xiaolei Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut Xi Zheng Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut Jiao Xiaojin Department of Electrical and Computer Engineering, University of Utah, 84112, Salt Lake City, UT, USA aut Yu Wenhai Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut Xue Guosheng Department of Optics and Optical Engineering, Bio-laser Laboratory, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut Zhang Douguo Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut Lu Yonghua Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut Wang Pei Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut Blair Steve Department of Electrical and Computer Engineering, University of Utah, 84112, Salt Lake City, UT, USA aut Ming Hai Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut Plasmonics Springer US; http://www.springer-ny.com 8/2(2013-06-01), 225-231 1557-1955 8:2<225 2013 8 11468 https://doi.org/10.1007/s11468-012-9379-8 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11468-012-9379-8 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Wen Xiaolei Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut NATIONALLICENCE 700 1- Xi Zheng Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut NATIONALLICENCE 700 1- Jiao Xiaojin Department of Electrical and Computer Engineering, University of Utah, 84112, Salt Lake City, UT, USA aut NATIONALLICENCE 700 1- Yu Wenhai Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut NATIONALLICENCE 700 1- Xue Guosheng Department of Optics and Optical Engineering, Bio-laser Laboratory, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut NATIONALLICENCE 700 1- Zhang Douguo Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut NATIONALLICENCE 700 1- Lu Yonghua Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut NATIONALLICENCE 700 1- Wang Pei Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut NATIONALLICENCE 700 1- Blair Steve Department of Electrical and Computer Engineering, University of Utah, 84112, Salt Lake City, UT, USA aut NATIONALLICENCE 700 1- Ming Hai Department of Optics and Optical Engineering, Anhui Key Laboratory of Optoelectronic Science and Technology, University of Science and Technology of China, 230026, Hefei, Anhui, People's Republic of China aut NATIONALLICENCE 773 0- Plasmonics Springer US; http://www.springer-ny.com 8/2(2013-06-01), 225-231 1557-1955 8:2<225 2013 8 11468 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer