cam a22 4 4500 555320952 CHVBK 20201018111658.0 cr ||||||||||| 180807s2018 xxu o|||| 101 |eng| 978-1-5106-1582-3 electronic 978-1-5106-1581-6 print (OCoLC)1085684437 (NEBIS)011352879 SzZuIDS NEBIS ETH-BIB ger rda Steep Dispersion Engineering and Opto-Atomic Precision Metrology Veranstaltung (11. 2018 San Francisco, Calif.) (DE-588)1177172402 Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI 29 January-1 February 2018, San Francisco, California, United States Selim M. Shahriar, Jacob Scheuer (editors) ; sponsored and published by SPIE Bellingham, Washington SPIE [2018] 1 Online-Ressource Text txt rdacontent/ger Computermedien c rdamedia/ger Online-Ressource cr rdacarrier/ger Proceedings of SPIE. 5200- volume 10548 Konferenzschrift San Francisco, Calif 2018 gnd-content Shahriar Selim M. Herausgeber edt Scheuer Jacob Herausgeber edt SPIE (DE-588)10182148-7 Sponsor spn Herausgebendes Organ isb http://sfx.ethz.ch/sfx_locater?sid=ALEPH:EBI01&genre=book&isbn=9781510615823 Online via SFX BK020853 XK020053 XK020000 EText nebis ED E01-Manuell nebis ER noalma ids I NEBIS E01 E01 EL NEBIS 111 2- Steep Dispersion Engineering and Opto-Atomic Precision Metrology Veranstaltung (11 2018 San Francisco, Calif) (DE-588)1177172402 NEBIS 490 0- Proceedings of SPIE. 5200- volume 10548 NEBIS 700 1- Shahriar Selim M. Herausgeber edt NEBIS 700 1- Scheuer Jacob Herausgeber edt NEBIS 710 2- SPIE (DE-588)10182148-7 Sponsor spn Herausgebendes Organ isb NEBIS 856 -- http://sfx.ethz.ch/sfx_locater?sid=ALEPH:EBI01&genre=book&isbn=9781510615823 Online via SFX SWISSBIB 555320952