A personal view on metrology in chemical analysis

Verfasser / Beitragende:
[Ivo Leito]
Ort, Verlag, Jahr:
2015
Enthalten in:
Accreditation and Quality Assurance, 20/3(2015-06-01), 229-231
Format:
Artikel (online)
ID: 605465746
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024 7 0 |a 10.1007/s00769-015-1131-6  |2 doi 
035 |a (NATIONALLICENCE)springer-10.1007/s00769-015-1131-6 
100 1 |a Leito  |D Ivo  |u Institute of Chemistry, University of Tartu, Ravila 14a, 50411, Tartu, Estonia  |4 aut 
245 1 2 |a A personal view on metrology in chemical analysis  |h [Elektronische Daten]  |c [Ivo Leito] 
520 3 |a This short communication presents the author's pragmatic view on the most important activities in applying the metrological principles to chemical analysis. 
540 |a Springer-Verlag Berlin Heidelberg, 2015 
690 7 |a Metrology in chemistry  |2 nationallicence 
690 7 |a Selectivity  |2 nationallicence 
690 7 |a Reference values  |2 nationallicence 
690 7 |a Random and systematic effects  |2 nationallicence 
690 7 |a Constant improvement  |2 nationallicence 
773 0 |t Accreditation and Quality Assurance  |d Springer Berlin Heidelberg  |g 20/3(2015-06-01), 229-231  |x 0949-1775  |q 20:3<229  |1 2015  |2 20  |o 769 
856 4 0 |u https://doi.org/10.1007/s00769-015-1131-6  |q text/html  |z Onlinezugriff via DOI 
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900 7 |a Metadata rights reserved  |b Springer special CC-BY-NC licence  |2 nationallicence 
908 |D 1  |a research-article  |2 jats 
949 |B NATIONALLICENCE  |F NATIONALLICENCE  |b NL-springer 
950 |B NATIONALLICENCE  |P 856  |E 40  |u https://doi.org/10.1007/s00769-015-1131-6  |q text/html  |z Onlinezugriff via DOI 
950 |B NATIONALLICENCE  |P 100  |E 1-  |a Leito  |D Ivo  |u Institute of Chemistry, University of Tartu, Ravila 14a, 50411, Tartu, Estonia  |4 aut 
950 |B NATIONALLICENCE  |P 773  |E 0-  |t Accreditation and Quality Assurance  |d Springer Berlin Heidelberg  |g 20/3(2015-06-01), 229-231  |x 0949-1775  |q 20:3<229  |1 2015  |2 20  |o 769