caa a22 4500 605465746 CHVBK 20210128100304.0 cr unu---uuuuu 210128e20150601xx s 000 0 eng 10.1007/s00769-015-1131-6 doi (NATIONALLICENCE)springer-10.1007/s00769-015-1131-6 Leito Ivo Institute of Chemistry, University of Tartu, Ravila 14a, 50411, Tartu, Estonia aut A personal view on metrology in chemical analysis [Elektronische Daten] [Ivo Leito] This short communication presents the author's pragmatic view on the most important activities in applying the metrological principles to chemical analysis. Springer-Verlag Berlin Heidelberg, 2015 Metrology in chemistry nationallicence Selectivity nationallicence Reference values nationallicence Random and systematic effects nationallicence Constant improvement nationallicence Accreditation and Quality Assurance Springer Berlin Heidelberg 20/3(2015-06-01), 229-231 0949-1775 20:3<229 2015 20 769 https://doi.org/10.1007/s00769-015-1131-6 text/html Onlinezugriff via DOI BK010053 XK010053 XK010000 Metadata rights reserved Springer special CC-BY-NC licence nationallicence 1 research-article jats NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE 856 40 https://doi.org/10.1007/s00769-015-1131-6 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Leito Ivo Institute of Chemistry, University of Tartu, Ravila 14a, 50411, Tartu, Estonia aut NATIONALLICENCE 773 0- Accreditation and Quality Assurance Springer Berlin Heidelberg 20/3(2015-06-01), 229-231 0949-1775 20:3<229 2015 20 769