caa a22 4500 605489955 CHVBK 20210128100502.0 cr unu---uuuuu 210128e20150901xx s 000 0 eng 10.1134/S1061933X1505018X doi (NATIONALLICENCE)springer-10.1134/S1061933X1505018X Extended fine structure of auger spectra of thermally oxidized silicon surface [Elektronische Daten] [V. Troyan, V. Loginov, P. Borisyuk, O. Vasil'ev] The data are presented on the evolution of the shape and position of the L 23 VV Auger line for the surface of single-crystal silicon Si(111) during its thermal oxidation. The fine structure of the high-energy region of the Auger spectrum is found to be related to the loss of energy by Auger electrons for plasmon excitation and electronic interband transitions, while the low-energy region may be associated with the effect of extension fine Auger structure (EXFAS). By the example of Si atoms in a thin surface layer of SiO2, it is shown that, similarly to studying the ordinary oscillations of the EXAFS absorption spectra, the EXFAS technique can be used to solve the problems of the restoration of the local environment of atoms. The interatomic distances calculated using the Fourier transform of the right-hand sides of the Auger spectra (EXFAS spectra) for the pure and oxidized silicon surfaces appear to be 2.2 and 1.7 Å, respectively, thereby coinciding with the published values within determination error. Pleiades Publishing, Ltd., 2015 Troyan V. MEPhI National Research Nuclear University, Kashirskoe sh. 31, 115409, Moscow, Russia aut Loginov V. MEPhI National Research Nuclear University, Kashirskoe sh. 31, 115409, Moscow, Russia aut Borisyuk P. MEPhI National Research Nuclear University, Kashirskoe sh. 31, 115409, Moscow, Russia aut Vasil'ev O. MEPhI National Research Nuclear University, Kashirskoe sh. 31, 115409, Moscow, Russia aut Colloid Journal Pleiades Publishing 77/5(2015-09-01), 635-640 1061-933X 77:5<635 2015 77 10595 https://doi.org/10.1134/S1061933X1505018X text/html Onlinezugriff via DOI BK010053 XK010053 XK010000 Metadata rights reserved Springer special CC-BY-NC licence nationallicence 1 research-article jats NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE 856 40 https://doi.org/10.1134/S1061933X1505018X text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Troyan V. MEPhI National Research Nuclear University, Kashirskoe sh. 31, 115409, Moscow, Russia aut NATIONALLICENCE 700 1- Loginov V. MEPhI National Research Nuclear University, Kashirskoe sh. 31, 115409, Moscow, Russia aut NATIONALLICENCE 700 1- Borisyuk P. MEPhI National Research Nuclear University, Kashirskoe sh. 31, 115409, Moscow, Russia aut NATIONALLICENCE 700 1- Vasil'ev O. MEPhI National Research Nuclear University, Kashirskoe sh. 31, 115409, Moscow, Russia aut NATIONALLICENCE 773 0- Colloid Journal Pleiades Publishing 77/5(2015-09-01), 635-640 1061-933X 77:5<635 2015 77 10595