caa a22 4500 606172947 CHVBK 20210128100730.0 cr unu---uuuuu 210128e20150901xx s 000 0 eng 10.1007/s10921-015-0294-8 doi (NATIONALLICENCE)springer-10.1007/s10921-015-0294-8 Fundamental Study of Microelectronic Chips' Response Under Laser Excitation and Signal Processing Methods [Elektronische Daten] [Lei Yang, Jie Gong, I. Ume] In surface-mount technology, the solder bumps between chips and printed circuit boards are difficult to inspect. The laser ultrasonic-interferometric (LUI) technique proved promising for the non-destructive inspection of solder bump qualities. Previous signal interpretation methods were based on the comparison of signal similarities. A fundamental insight into the chips' response under the laser excitation was lacking. In this paper, a C-scan procedure was performed to inspect the full surface of chips. This procedure, along with different signal processing techniques such as continuous wavelet transformation, ideal filters and multi-dimensional Fourier transform, established a fundamental understanding of the LUI signals acquired from different chips. Springer Science+Business Media New York, 2015 Laser ultrasonic nationallicence Multi-dimensional FT nationallicence Solder bump nationallicence Yang Lei Georgia Institute of Technology, 30332, Atlanta, GA, USA aut Gong Jie Georgia Institute of Technology, 30332, Atlanta, GA, USA aut Ume I. Georgia Institute of Technology, 30332, Atlanta, GA, USA aut Journal of Nondestructive Evaluation Springer US; http://www.springer-ny.com 34/3(2015-09-01), 1-8 0195-9298 34:3<1 2015 34 10921 https://doi.org/10.1007/s10921-015-0294-8 text/html Onlinezugriff via DOI BK010053 XK010053 XK010000 Metadata rights reserved Springer special CC-BY-NC licence nationallicence 1 research-article jats NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE 856 40 https://doi.org/10.1007/s10921-015-0294-8 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Yang Lei Georgia Institute of Technology, 30332, Atlanta, GA, USA aut NATIONALLICENCE 700 1- Gong Jie Georgia Institute of Technology, 30332, Atlanta, GA, USA aut NATIONALLICENCE 700 1- Ume I. Georgia Institute of Technology, 30332, Atlanta, GA, USA aut NATIONALLICENCE 773 0- Journal of Nondestructive Evaluation Springer US; http://www.springer-ny.com 34/3(2015-09-01), 1-8 0195-9298 34:3<1 2015 34 10921