caa a22 4500 606172971 CHVBK 20210128100731.0 cr unu---uuuuu 210128e20151201xx s 000 0 eng 10.1007/s10921-015-0315-7 doi (NATIONALLICENCE)springer-10.1007/s10921-015-0315-7 GDXray: The Database of X-ray Images for Nondestructive Testing [Elektronische Daten] [Domingo Mery, Vladimir Riffo, Uwe Zscherpel, German Mondragón, Iván Lillo, Irene Zuccar, Hans Lobel, Miguel Carrasco] In this paper, we present a new dataset consisting of 19,407 X-ray images. The images are organized in a public database called $$\mathbb {GDX}$$ GDX ray that can be used free of charge, but for research and educational purposes only. The database includes five groups of X-ray images: castings, welds, baggage, natural objects and settings. Each group has several series, and each series several X-ray images. Most of the series are annotated or labeled. In such cases, the coordinates of the bounding boxes of the objects of interest or the labels of the images are available in standard text files. The size of $$\mathbb {GDX}$$ GDX ray is 3.5 GB and it can be downloaded from our website. We believe that $$\mathbb {GDX}$$ GDX ray represents a relevant contribution to the X-ray testing community. On the one hand, students, researchers and engineers can use these X-ray images to develop, test and evaluate image analysis and computer vision algorithms without purchasing expensive X-ray equipment. On the other hand, these images can be used as a benchmark in order to test and compare the performance of different approaches on the same data. Moreover, the database can be used in the training programs of human inspectors. Springer Science+Business Media New York, 2015 X-ray testing nationallicence Datasets nationallicence X-ray images nationallicence Computer vision nationallicence Image analysis nationallicence Mery Domingo Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut Riffo Vladimir Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut Zscherpel Uwe BAM Federal Institute for Materials Research and Testing, Berlin, Germany aut Mondragón German Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut Lillo Iván Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut Zuccar Irene Departamento de Ingeniería Informática-Universidad de Santiago de Chile, Santiago, Chile aut Lobel Hans Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut Carrasco Miguel Faculty of Engineering and Sciences, Universidad Adolfo Ibáñez, Santiago, Chile aut Journal of Nondestructive Evaluation Springer US; http://www.springer-ny.com 34/4(2015-12-01), 1-12 0195-9298 34:4<1 2015 34 10921 https://doi.org/10.1007/s10921-015-0315-7 text/html Onlinezugriff via DOI BK010053 XK010053 XK010000 Metadata rights reserved Springer special CC-BY-NC licence nationallicence 1 research-article jats NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE 856 40 https://doi.org/10.1007/s10921-015-0315-7 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Mery Domingo Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut NATIONALLICENCE 700 1- Riffo Vladimir Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut NATIONALLICENCE 700 1- Zscherpel Uwe BAM Federal Institute for Materials Research and Testing, Berlin, Germany aut NATIONALLICENCE 700 1- Mondragón German Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut NATIONALLICENCE 700 1- Lillo Iván Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut NATIONALLICENCE 700 1- Zuccar Irene Departamento de Ingeniería Informática-Universidad de Santiago de Chile, Santiago, Chile aut NATIONALLICENCE 700 1- Lobel Hans Department of Computer Science, Pontificia Universidad Católica de Chile, Santiago, Chile aut NATIONALLICENCE 700 1- Carrasco Miguel Faculty of Engineering and Sciences, Universidad Adolfo Ibáñez, Santiago, Chile aut NATIONALLICENCE 773 0- Journal of Nondestructive Evaluation Springer US; http://www.springer-ny.com 34/4(2015-12-01), 1-12 0195-9298 34:4<1 2015 34 10921