caa a22 4500 606173161 CHVBK 20210128100731.0 cr unu---uuuuu 210128e20150601xx s 000 0 eng 10.1007/s10921-015-0282-z doi (NATIONALLICENCE)springer-10.1007/s10921-015-0282-z Addressing Memory and Speed Problems in Nondestructive Defect Characterization: Element-by-Element Processing on a GPU [Elektronische Daten] [S. Sivasuthan, V. Karthik, A. Rahunanthan, P. Jayakumar, R. Thyagarajan, Lalita Udpa, S. Hoole] In nondestructive defect characterization, the genetic algorithm matches measurements to computations through finite element optimization of a parametrically described defect. This poses a huge computational load. A published element-by-element (EbE) conjugate gradients (CG) method for the graphics processing unit (GPU) parallelizes the matrix solution process. However, in finite element optimization for non-destructive evaluation (NDE), thousands of simultaneous finite element matrix solutions on parallel genetic algorithm threads on a GPU are required. This challenges the memory capabilities of a GPU and results in long waiting times making the NDE technique impracticable. To address these twin time and memory problems, we revive an old EbE processing by Gauss iterations. It yields speedups of 80+ which grow indefinitely with matrix size to values much bigger than those reported for EbE CG. For the latter the reported figures were less than 4 for the practicable matrix size of 91,333, and 96 for a size of over 1 million and falling thereafter. Our EbE implementation of CG gives a speedup of 147 for first order triangular meshes. No memory issues are faced. Springer Science+Business Media New York (outside the US), 2015 CUDA nationallicence GPU nationallicence FEM nationallicence Parallelization nationallicence NDE nationallicence Sivasuthan S. Electrical and Computer Engineering Department, Michigan State University, 48824, East Lansing, MI, USA aut Karthik V. Electrical and Computer Engineering Department, Michigan State University, 48824, East Lansing, MI, USA aut Rahunanthan A. Department of Mathematics and Computer Science, Edinboro University, 16444, Edinboro, PA, USA aut Jayakumar P. US Army Tank Automotive Research Development and Engineering Center, 48397-5000, Warren, MI, USA aut Thyagarajan R. US Army Tank Automotive Research Development and Engineering Center, 48397-5000, Warren, MI, USA aut Udpa Lalita Electrical and Computer Engineering Department, Michigan State University, 48824, East Lansing, MI, USA aut Hoole S. Electrical and Computer Engineering Department, Michigan State University, 48824, East Lansing, MI, USA aut Journal of Nondestructive Evaluation Springer US; http://www.springer-ny.com 34/2(2015-06-01), 1-7 0195-9298 34:2<1 2015 34 10921 https://doi.org/10.1007/s10921-015-0282-z text/html Onlinezugriff via DOI BK010053 XK010053 XK010000 Metadata rights reserved Springer special CC-BY-NC licence nationallicence 1 research-article jats NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE 856 40 https://doi.org/10.1007/s10921-015-0282-z text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Sivasuthan S. Electrical and Computer Engineering Department, Michigan State University, 48824, East Lansing, MI, USA aut NATIONALLICENCE 700 1- Karthik V. Electrical and Computer Engineering Department, Michigan State University, 48824, East Lansing, MI, USA aut NATIONALLICENCE 700 1- Rahunanthan A. Department of Mathematics and Computer Science, Edinboro University, 16444, Edinboro, PA, USA aut NATIONALLICENCE 700 1- Jayakumar P. US Army Tank Automotive Research Development and Engineering Center, 48397-5000, Warren, MI, USA aut NATIONALLICENCE 700 1- Thyagarajan R. US Army Tank Automotive Research Development and Engineering Center, 48397-5000, Warren, MI, USA aut NATIONALLICENCE 700 1- Udpa Lalita Electrical and Computer Engineering Department, Michigan State University, 48824, East Lansing, MI, USA aut NATIONALLICENCE 700 1- Hoole S. Electrical and Computer Engineering Department, Michigan State University, 48824, East Lansing, MI, USA aut NATIONALLICENCE 773 0- Journal of Nondestructive Evaluation Springer US; http://www.springer-ny.com 34/2(2015-06-01), 1-7 0195-9298 34:2<1 2015 34 10921