caa a22 4500 606242120 CHVBK 20210128101317.0 cr unu---uuuuu 210128e20151201xx s 000 0 eng 10.1007/s11336-015-9458-9 doi (NATIONALLICENCE)springer-10.1007/s11336-015-9458-9 Constrained Dual Scaling for Detecting Response Styles in Categorical Data [Elektronische Daten] [Pieter Schoonees, Michel van de Velden, Patrick Groenen] Dual scaling (DS) is a multivariate exploratory method equivalent to correspondence analysis when analysing contingency tables. However, for the analysis of rating data, different proposals appear in the DS and correspondence analysis literature. It is shown here that a peculiarity of the DS method can be exploited to detect differences in response styles. Response styles occur when respondents use rating scales differently for reasons not related to the questions, often biasing results. A spline-based constrained version of DS is devised which can detect the presence of four prominent types of response styles, and is extended to allow for multiple response styles. An alternating nonnegative least squares algorithm is devised for estimating the parameters. The new method is appraised both by simulation studies and an empirical application. The Author(s), 2015 response style nationallicence dual scaling nationallicence correspondence analysis nationallicence splines nationallicence nonnegative least squares nationallicence $$K$$ K -means nationallicence Schoonees Pieter Econometric Institute, Erasmus University Rotterdam, Rotterdam, The Netherlands aut van de Velden Michel Econometric Institute, Erasmus University Rotterdam, Rotterdam, The Netherlands aut Groenen Patrick Econometric Institute, Erasmus University Rotterdam, Rotterdam, The Netherlands aut Psychometrika Springer US; http://www.springer-ny.com 80/4(2015-12-01), 968-994 0033-3123 80:4<968 2015 80 11336 https://doi.org/10.1007/s11336-015-9458-9 text/html Onlinezugriff via DOI BK010053 XK010053 XK010000 Metadata rights reserved Springer special CC-BY-NC licence nationallicence 1 research-article jats NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE 856 40 https://doi.org/10.1007/s11336-015-9458-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Schoonees Pieter Econometric Institute, Erasmus University Rotterdam, Rotterdam, The Netherlands aut NATIONALLICENCE 700 1- van de Velden Michel Econometric Institute, Erasmus University Rotterdam, Rotterdam, The Netherlands aut NATIONALLICENCE 700 1- Groenen Patrick Econometric Institute, Erasmus University Rotterdam, Rotterdam, The Netherlands aut NATIONALLICENCE 773 0- Psychometrika Springer US; http://www.springer-ny.com 80/4(2015-12-01), 968-994 0033-3123 80:4<968 2015 80 11336