caa a22 4500 606244026 CHVBK 20210128101328.0 cr unu---uuuuu 210128e20150901xx s 000 0 eng 10.1007/s12596-015-0252-y doi (NATIONALLICENCE)springer-10.1007/s12596-015-0252-y Determination of roughness and correlation length of dielectric surfaces in nano/micro scales using Kirchhoff Approximation method [Elektronische Daten] [M. Mahdieh, E. Badomi] In this paper determination of surface roughness and correlation length for dielectrics were extensively investigated by applying Kirchhoff Approximation method for second order. The technique is based on two dimensional analysis of scattered light intensity from a dielectric rough surface. The result show that the scattered intensities from a dielectric rough surface for the second order approximation are almost the same as for the first order. The results also show that by using Kirchhoff Approximation method, both surface roughness and correlation length simultaneously can be determined, if the scattered light intensity for two different incident angles is known. The investigations also show that the accuracy for evaluating the ratio of scattered light intensity to incident light intensity can influence the results. The Optical Society of India, 2015 Dielectric surface nationallicence Roughness nationallicence Correlation length nationallicence Nano scale roughness nationallicence Kischhoff approximation nationallicence Scattered light intensity nationallicence Two dimensional rough surface nationallicence Mahdieh M. Department of Physics, Iran University of Science and Technology, 13114-16846, Narmak, Tehran, Iran aut Badomi E. Department of Physics, Iran University of Science and Technology, 13114-16846, Narmak, Tehran, Iran aut Journal of Optics Springer India 44/3(2015-09-01), 240-248 0972-8821 44:3<240 2015 44 12596 https://doi.org/10.1007/s12596-015-0252-y text/html Onlinezugriff via DOI BK010053 XK010053 XK010000 Metadata rights reserved Springer special CC-BY-NC licence nationallicence 1 research-article jats NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE 856 40 https://doi.org/10.1007/s12596-015-0252-y text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Mahdieh M. Department of Physics, Iran University of Science and Technology, 13114-16846, Narmak, Tehran, Iran aut NATIONALLICENCE 700 1- Badomi E. Department of Physics, Iran University of Science and Technology, 13114-16846, Narmak, Tehran, Iran aut NATIONALLICENCE 773 0- Journal of Optics Springer India 44/3(2015-09-01), 240-248 0972-8821 44:3<240 2015 44 12596