Effect of bias voltage and temperature on lifetime of wireless neural interfaces with Al2O3 and parylene bilayer encapsulation

Verfasser / Beitragende:
[Xianzong Xie, Loren Rieth, Ryan Caldwell, Sandeep Negi, Rajmohan Bhandari, Rohit Sharma, Prashant Tathireddy, Florian Solzbacher]
Ort, Verlag, Jahr:
2015
Enthalten in:
Biomedical Microdevices, 17/1(2015-02-01), 1-8
Format:
Artikel (online)
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024 7 0 |a 10.1007/s10544-014-9904-y  |2 doi 
035 |a (NATIONALLICENCE)springer-10.1007/s10544-014-9904-y 
245 0 0 |a Effect of bias voltage and temperature on lifetime of wireless neural interfaces with Al2O3 and parylene bilayer encapsulation  |h [Elektronische Daten]  |c [Xianzong Xie, Loren Rieth, Ryan Caldwell, Sandeep Negi, Rajmohan Bhandari, Rohit Sharma, Prashant Tathireddy, Florian Solzbacher] 
520 3 |a The lifetime of neural interfaces is a critical challenge for chronic implantations, as therapeutic devices (e.g., neural prosthetics) will require decades of lifetime. We evaluated the lifetime of wireless Utah electrode array (UEA) based neural interfaces with a bilayer encapsulation scheme utilizing a combination of alumina deposited by Atomic Layer Deposition (ALD) and parylene C. Wireless integrated neural interfaces (INIs), equipped with recording version 9 (INI-R9) ASIC chips, were used to monitor the encapsulation performance through radio-frequency (RF) power and telemetry. The wireless devices were encapsulated with 52nm of ALD Al2O3 and 6μm of parylene C, and tested by soaking in phosphate buffered solution (PBS) at 57°C for 4× accelerated lifetime testing. The INIs were also powered continuously through 2.765MHz inductive power and forward telemetry link at unregulated 5V. The bilayer encapsulated INIs were fully functional for ∼35days (140days at 37°C equivalent) with consistent power-up frequencies (∼910MHz), stable RF signal (∼−75 dBm), and 100% command reception rate. This is ∼10 times of equivalent lifetime of INIs with parylene-only encapsulation (13days) under same power condition at 37°C. The bilayer coated INIs without continuous powering lasted over 1860 equivalent days (still working) at 37°C. Those results suggest that bias stress is a significant factor to accelerate the failure of the encapsulated devices. The INIs failed completely within 5days of the initial frequency shift of RF signal at 57°C, which implied that the RF frequency shift is an early indicator of encapsulation/device failure. 
540 |a Springer Science+Business Media New York, 2015 
690 7 |a Neural interface  |2 nationallicence 
690 7 |a Utah electrode array  |2 nationallicence 
690 7 |a Atomic layer deposited (ALD) Al2O3  |2 nationallicence 
690 7 |a Parylene  |2 nationallicence 
690 7 |a Bilayer encapsulation  |2 nationallicence 
690 7 |a Continuous bias voltage  |2 nationallicence 
690 7 |a Accelerated aging  |2 nationallicence 
690 7 |a Long-term reliability  |2 nationallicence 
700 1 |a Xie  |D Xianzong  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
700 1 |a Rieth  |D Loren  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
700 1 |a Caldwell  |D Ryan  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
700 1 |a Negi  |D Sandeep  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
700 1 |a Bhandari  |D Rajmohan  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
700 1 |a Sharma  |D Rohit  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
700 1 |a Tathireddy  |D Prashant  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
700 1 |a Solzbacher  |D Florian  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
773 0 |t Biomedical Microdevices  |d Springer US; http://www.springer-ny.com  |g 17/1(2015-02-01), 1-8  |x 1387-2176  |q 17:1<1  |1 2015  |2 17  |o 10544 
856 4 0 |u https://doi.org/10.1007/s10544-014-9904-y  |q text/html  |z Onlinezugriff via DOI 
898 |a BK010053  |b XK010053  |c XK010000 
900 7 |a Metadata rights reserved  |b Springer special CC-BY-NC licence  |2 nationallicence 
908 |D 1  |a research-article  |2 jats 
949 |B NATIONALLICENCE  |F NATIONALLICENCE  |b NL-springer 
950 |B NATIONALLICENCE  |P 856  |E 40  |u https://doi.org/10.1007/s10544-014-9904-y  |q text/html  |z Onlinezugriff via DOI 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Xie  |D Xianzong  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Rieth  |D Loren  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Caldwell  |D Ryan  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Negi  |D Sandeep  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Bhandari  |D Rajmohan  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Sharma  |D Rohit  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Tathireddy  |D Prashant  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Solzbacher  |D Florian  |u University of Utah, Salt Lake City, UT, USA  |4 aut 
950 |B NATIONALLICENCE  |P 773  |E 0-  |t Biomedical Microdevices  |d Springer US; http://www.springer-ny.com  |g 17/1(2015-02-01), 1-8  |x 1387-2176  |q 17:1<1  |1 2015  |2 17  |o 10544